Logistic Test Effort Function Based Software Reliability Growth Model with Multi Up-gradation

Ajay Kumar Gupta, Suneet Saxena, Nancy Achrya


This paper presents the development of the software reliability growth model under multi up-gradation process. In up gradation process new version of the software is released in the market with some new features. The process
is repeated and referred to as multi-up gradation. The model has been developed using logistic test effort function. logistic distribution described increasing/decreasing phenomenon fairly. Three generations of the model have been developed and
compared using statistical tools R2 and MSE. Results validate good fitting of the third generation to a given dataset.


NHPP, Software Reliability, Multi up-gradation, logistic TEF

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DOI: http://dx.doi.org/10.29218/srmsjoms.v4i01.15951

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